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International Journal of Current Microbiology and Applied Sciences (IJCMAS)
IJCMAS is now DOI (CrossRef) registered Research Journal. The DOIs are assigned to all published IJCMAS Articles.
Index Copernicus ICI Journals Master List 2018 - IJCMAS--ICV 2018: 95.39 For more details click here
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National Academy of Agricultural Sciences (NAAS)
NAAS Score: *5.38 (2020)
[Effective from January 1, 2020]
For more details click here

ICV 2018: 95.39
Index Copernicus ICI Journals Master List 2018 - IJCMAS--ICV 2018: 95.39
For more details click here

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PRINT ISSN : 2319-7692
Online ISSN : 2319-7706
Issues : 12 per year
Publisher : Excellent Publishers
Email : editorijcmas@gmail.com / submit@ijcmas.com
Editor-in-chief: Dr.M.Prakash
Index Copernicus ICV 2018: 95.39
NAAS RATING 2020: 5.38

Int.J.Curr.Microbiol.App.Sci.2018.7(7): 937-945
DOI: https://doi.org/10.20546/ijcmas.2018.707.113


Studies on Correlation and Path Analysis for Spot Blotch Disease Resistance and Yield Parameters in F2 Segregating Population of Durum Wheat (Triticum durum L.)
C.K. Chethana1, V. Rudranaik1*, S.A. Desai2, S.S. Biradar1, Y. Narendra Kadoo3, I.K. Kalappanavar4 and B.N. Aravindkumar5
1AICRP on Wheat, Main Agricultural Research Station, University of Agricultural Sciences Dharwad - 580 005, Karnataka, India
2Protection of Plant Varieties and Farmer’s Right Authority (PPV & FRA), PUSA, NewDelhi-110012, India)
3Biochemical Sciences Division, CSIR-National Chemical Laboratory, Pune, Maharasthra, India
4Department of Plant Pathology
5Department of Agronomy, University of Agricultural Sciences Dharwad - 580 005, Karnataka, India
*Corresponding author
Abstract:

The experiment was conducted to examine the nature of association among seed yield, its component traits and spot blotch resistance traits in F2 population of the cross Bijaga yellow x NIDW-295. Simple correlation analysis revealed that the significant positive correlation of spot blotch resistance traits such as disease severity (%) and AUDPC showed that highly significant and negative association with number of tillers per plant, spike length, number of spikelets per spike, number of grain per spike, thousand grain weight and seed yield per plant implies that indirect selection for these traits helps in development of spot blotch resistant genotypes. From the path coefficient analysis based on correlations, it was observed that the maximum direct positive effect on seed yield per plant was exhibited by thousand grain weight followed by number of tillers per plant, number of grains per spike and spike length whereas spot blotch severity (%) and AUDPC showed direct negative effects on seed yield and its component characters. Thus, these characters plays significant role in the formation of selection criteria to enhance the resistance to spot blotch in bread wheat. Present investigation suggests that selection in F2 population of Bijaga yellow x NIDW-295 will be effective in selecting superior plants for yield parameters and spot blotch resistance in evolving high yielding disease resistant genotype in durum wheat.


Keywords: Spot blotch, Correlation, Path analysis, Disease severity (%), Area under disease progress curve (AUDPC).
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How to cite this article:

Chethana, C.K., V. Rudranaik, S.A. Desai, S.S. Biradar, Y. Narendra Kadoo, I.K. Kalappanavar and Aravindkumar, B.N. 2018. Studies on Correlation and Path Analysis for Spot Blotch Disease Resistance and Yield Parameters in F2 Segregating Population of Durum Wheat (Triticum durum L.).Int.J.Curr.Microbiol.App.Sci. 7(7): 937-945. doi: https://doi.org/10.20546/ijcmas.2018.707.113