National Academy of Agricultural Sciences (NAAS)
|
PRINT ISSN : 2319-7692
Online ISSN : 2319-7706 Issues : 12 per year Publisher : Excellent Publishers Email : editorijcmas@gmail.com / submit@ijcmas.com Editor-in-chief: Dr.M.Prakash Index Copernicus ICV 2018: 95.39 NAAS RATING 2020: 5.38 |
The experiment was conducted to examine the nature of association among seed yield, its component traits and spot blotch resistance traits in F2 population of the cross Bijaga yellow x NIDW-295. Simple correlation analysis revealed that the significant positive correlation of spot blotch resistance traits such as disease severity (%) and AUDPC showed that highly significant and negative association with number of tillers per plant, spike length, number of spikelets per spike, number of grain per spike, thousand grain weight and seed yield per plant implies that indirect selection for these traits helps in development of spot blotch resistant genotypes. From the path coefficient analysis based on correlations, it was observed that the maximum direct positive effect on seed yield per plant was exhibited by thousand grain weight followed by number of tillers per plant, number of grains per spike and spike length whereas spot blotch severity (%) and AUDPC showed direct negative effects on seed yield and its component characters. Thus, these characters plays significant role in the formation of selection criteria to enhance the resistance to spot blotch in bread wheat. Present investigation suggests that selection in F2 population of Bijaga yellow x NIDW-295 will be effective in selecting superior plants for yield parameters and spot blotch resistance in evolving high yielding disease resistant genotype in durum wheat.
Citations |
 |
 |
 |
 |
