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International Journal of Current Microbiology and Applied Sciences (IJCMAS)
IJCMAS is now DOI (CrossRef) registered Research Journal. The DOIs are assigned to all published IJCMAS Articles.
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National Academy of Agricultural Sciences (NAAS)
NAAS Score: *5.38 (2020)
[Effective from January 1, 2020]
For more details click here

ICV 2018: 95.39
Index Copernicus ICI Journals Master List 2018 - IJCMAS--ICV 2018: 95.39
For more details click here

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Original Research Articles

PRINT ISSN : 2319-7692
Online ISSN : 2319-7706
Issues : 12 per year
Publisher : Excellent Publishers
Email : editorijcmas@gmail.com / submit@ijcmas.com
Editor-in-chief: Dr.M.Prakash
Index Copernicus ICV 2018: 95.39
NAAS RATING 2020: 5.38

Int.J.Curr.Microbiol.App.Sci.2017.6(10): 3592-3599
DOI: https://doi.org/10.20546/ijcmas.2017.610.423


Genetic Studies on the Effect of Slow Rusting Genes Lr34 and Lr68 on Minimizing Grain Yield Losses in Back Cross Segregating Populations of the Cross GW322 X Parula in Bread Wheat (Triticum aestivum L.)
Ashutosh Kumar1, S.A. Desai1*, Suma S. Biradar2, K.J. Yashavantha Kumar3, P.V. Patil2, V. Rudra Naik2, T.N. Sathisha1 and Bhumika N. Patel1
1Department of Genetics and Plant Breeding
2ICAR-AICRP on Wheat, MARS, University of Agricultural Sciences, Dharwad-580005, Karnataka, India
3Agharkar Research Institute, Pune, India
*Corresponding author
Abstract:

Achieving durability of resistance and minimizing yield losses due to Leaf rust, caused by Puccinia triticina Eriks, in wheat has been one of the major objective of breeding programs. The slow rusting genes that are quantitatively inherited, are known to confer durable type of resistance. In present investigation our objective was to study the effects Lr34 and Lr68 genes on minimizing grain yield losses using backcross segregating populations of the cross GW322 X PARULA. For this comparison of grain yield was made in protected and non-protected treatments. Experimental materials were screened with linked molecular markers to detect the presence of genes conferring resistance to leaf rust. Overall yield losses in presence of slow rusting genes Lr34, Lr68 and in combination of both Lr34 and Lr68 were 14.98 %, 16.36 % and 13.27 % respectively which was comparatively much lower than yield losses in absence of both the slow rusting genes (33.15%). Yield losses were associated mainly with the reduction in grain yield per plant and thousand grain weight. These plants with both the genes in combination and having lower yield losses are the potential lines for further development of varieties. We conclude that although the presence of slow rusting genes which is linked with leaf tip necrosis of adult plants, causing reduction in net photosynthetic area could provide substantial protection to grain yield in high disease pressure.


Keywords: Leaf rust, Slow rusting gene, Yield losses.
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How to cite this article: Ashutosh Kumar, S.A. Desai, Suma S. Biradar, K.J. Yashavantha Kumar, P.V. Patil, V. Rudra Naik, T.N. Sathisha and Bhumika N. Patel. 2017. Genetic Studies on the Effect of Slow Rusting Genes Lr34 and Lr68 on Minimizing Grain Yield Losses in Back Cross Segregating Populations of the Cross GW322 X Parula in Bread Wheat (Triticum aestivum L.). Int.J.Curr.Microbiol.App.Sci. 6(10): 3592-3599. doi: https://doi.org/10.20546/ijcmas.2017.610.423Int.J.Curr.Microbiol.App.Sci. 6(10): 3592-3599. doi: https://doi.org/10.20546/ijcmas.2017.610.423