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International Journal of Current Microbiology and Applied Sciences (IJCMAS)
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Original Research Articles                      Volume : 7, Issue:1, January, 2018

PRINT ISSN : 2319-7692
Online ISSN : 2319-7706
Issues : 12 per year
Publisher : Excellent Publishers
Email : editorijcmas@gmail.com /
submit@ijcmas.com
Editor-in-chief: Dr.M.Prakash
Index Copernicus ICV 2018: 95.39
NAAS RATING 2020: 5.38

Int.J.Curr.Microbiol.App.Sci.2018.7(1): 1843-1847
DOI: https://doi.org/10.20546/ijcmas.2018.701.224


Combining Ability Analysis for Yield and Spot Blotch Disease Resistance in Tetraploid Wheat
Bhumika N. Patel1, S.A. Desai1, V. Rudranaik2, Suma S. Biradar2*, H.R. Arpitha1 and Ashutosh Kumar1
1Department of Genetics and Plant Breeding, University of Agricultural Sciences, Dharwad- 580005, Karnataka, India
2ICAR-AICRP on Wheat, MARS, University of Agricultural Sciences, Dharwad- 580005, Karnataka, India
*Corresponding author
Abstract:

The combining ability for yield and spot blotch disease resistance was studied in 21 cross combinations generated by crossing the selected spot blotch resistant and susceptible parents in 7 x 7 half half diallel design. Analysis of variance for combining ability indicated that SCA variance was higher than GCA variance for all the traits under study. The GCA component was significant for all the traits studied except for the trait thousand grain weight. The SCA component was significant for all the traits except for number of productive tillers per plant and thousand grain weight. The magnitude of sca variance was greater than gca variance for all the traits. The magnitude and direction of gca effects indicated HI 8663 and UAS 428 as good general combiners for yield and disease resistance. The cross combinations UAS 428 x A-9-30-1 and HI 8663 x DDK 1001 were identified as superior specific combiners for yield while, UAS 428 x DDK 1001, UAS 428 x A-9-30-1 and HI 8663 x NP 200 were found to be superior for disease resistance.


Keywords: General and specific combining ability, Spot blotch, Half diallel

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How to cite this article:

Bhumika N. Patel, S.A. Desai, V. Rudranaik, Suma S. Biradar, H.R. Arpitha and Ashutosh Kumar. 2018. Combining Ability Analysis for Yield and Spot Blotch Disease Resistance in Tetraploid Wheat.Int.J.Curr.Microbiol.App.Sci. 7(1): 1843-1847. doi: https://doi.org/10.20546/ijcmas.2018.701.224
Copyright: This is an Open Access article distributed under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike license.

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