National Academy of Agricultural Sciences (NAAS)
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PRINT ISSN : 2319-7692
Online ISSN : 2319-7706 Issues : 12 per year Publisher : Excellent Publishers Email : editorijcmas@gmail.com / submit@ijcmas.com Editor-in-chief: Dr.M.Prakash Index Copernicus ICV 2018: 95.39 NAAS RATING 2020: 5.38 |
A Scanning Electron Microscope (SEM) is a powerful magnification tool that utilizes focused beams of electrons to obtain information. The high-resolution, three-dimensional images produced by SEMs provide topographical, morphological and compositional information makes them invaluable in a variety of science and industry applications. A Scanning Electron Microscope provides detailed surface data of solid samples. It takes incidental electrons and focuses them onto a specimen; the electrons that scatter off the surface following this interaction can be analyzed with a variety of detectors that provide topographical, morphological and compositional information regarding the surface of a sample. Although SEMs are large, expensive pieces of equipment, they remain popular among researchers due to their wide range of applications and capabilities, including the high-resolution, three-dimensional, detailed images they produce.
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