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International Journal of Current Microbiology and Applied Sciences (IJCMAS)
IJCMAS is now DOI (CrossRef) registered Research Journal. The DOIs are assigned to all published IJCMAS Articles.
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National Academy of Agricultural Sciences (NAAS)
NAAS Score: *5.38 (2019)
[Effective from January 1, 2019]
For more details click here

ICV 2017: 100.00
Index Copernicus ICI Journals Master List 2017 - IJCMAS--ICV 2017: 100.00
For more details click here

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Original Research Articles

PRINT ISSN : 2319-7692
Online ISSN : 2319-7706
Issues : 12 per year
Publisher : Excellent Publishers
Email : editorijcmas@gmail.com / submit@ijcmas.com
Editor-in-chief: Dr.M.Prakash
Index Copernicus ICV 2017: 100.00
NAAS RATING 2018: 5.38

Int.J.Curr.Microbiol.App.Sci.2017.6(5): 1877-1882
DOI: https://doi.org/10.20546/ijcmas.2017.605.207


Scanning Electron Microscope: Advantages and Disadvantages in Imaging Components
Om Prakash Choudhary* and Priyanka
1Department of Veterinary Anatomy and Histology, College of Veterinary Sciences and Animal Husbandry, Central Agricultural University, Selesih, Aizawl-796014, Mizoram, India
2Department of Veterinary Microbiology, College of Veterinary and Animal Sciences,Rajasthan University of Veterinary and Animal Sciences, Bikaner-334001, Rajasthan, India
*Corresponding author
Abstract:

A Scanning Electron Microscope (SEM) is a powerful magnification tool that utilizes focused beams of electrons to obtain information. The high-resolution, three-dimensional images produced by SEMs provide topographical, morphological and compositional information makes them invaluable in a variety of science and industry applications. A Scanning Electron Microscope provides detailed surface data of solid samples. It takes incidental electrons and focuses them onto a specimen; the electrons that scatter off the surface following this interaction can be analyzed with a variety of detectors that provide topographical, morphological and compositional information regarding the surface of a sample. Although SEMs are large, expensive pieces of equipment, they remain popular among researchers due to their wide range of applications and capabilities, including the high-resolution, three-dimensional, detailed images they produce.


Keywords: Scanning electron microscope, Electrons, High-resolution, Three-dimensional images
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How to cite this article:

Om Prakash Choudhary and Priyanka. 2017. Scanning Electron Microscope: Advantages and Disadvantages in Imaging ComponentsInt.J.Curr.Microbiol.App.Sci. 6(5): 1877-1882. doi: https://doi.org/10.20546/ijcmas.2017.605.207