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International Journal of Current Microbiology and Applied Sciences (IJCMAS)
IJCMAS is now DOI (CrossRef) registered Research Journal. The DOIs are assigned to all published IJCMAS Articles.
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National Academy of Agricultural Sciences (NAAS)
NAAS Score: *5.38 (2019)
[Effective from January 1, 2019]
For more details click here

ICV 2018: 95.39
Index Copernicus ICI Journals Master List 2017 - IJCMAS--ICV 2018: 95.39
For more details click here

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PRINT ISSN : 2319-7692
Online ISSN : 2319-7706
Issues : 12 per year
Publisher : Excellent Publishers
Email : editorijcmas@gmail.com / submit@ijcmas.com
Editor-in-chief: Dr.M.Prakash
Index Copernicus ICV 2018: 95.39
NAAS RATING 2020: 5.38

Int.J.Curr.Microbiol.App.Sci.2020.9(3): 1103-1108
DOI: https://doi.org/10.20546/ijcmas.2020.903.129


Synthetic Hexaploid Wheat ‘Synthetic 45’: A Novel Source for Leaf Rust Resistance Gene in Wheat
Prem Chand Gyani1*, Pooja Yadav2 and J. B. Sharma1
1Division of Genetics, ICAR-Indian Agricultural Research Institute, New Delhi 110012, India
2Department of Genetics and Plant Breeding, RVSKVV, Gwalior 474002, India
*Corresponding author
Abstract:

Wheat rusts (Leaf rust, Stem rust and Stripe rust) continue to pose a serious threat by inflicting losses in different parts of world. Leaf rust caused by Puccinia triticina Eriks. is the most common rust disease of wheat (Triticum aestivum L.) and is widespread in India and posses a major threat to the wheat production of the country. Depending upon the severity and duration of infection, the losses may reach up to 50% of the yield. CIMMYT has developed a series of synthetic hexaploid wheat (SHW) by incorporating D genome donor Triticum tauschii in T. durum cultivars. In the present study one of these SHWs, Synthetic 45 was investigated for effectivity of leaf rust resistance. Characterization of leaf rust resistance in Synthetic 45 by multipathotype testing showed high degree of broad spectrum resistance at seedling stage to diverse 15 pathotypes of leaf rust pathogen in India.


Keywords: Wheat, SHWs, leaf rust, resistance, disease, wheat rust
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How to cite this article:

Prem Chand Gyani, Pooja Yadav and Sharma. J. B. 2020. Synthetic Hexaploid Wheat ‘Synthetic 45’: A Novel Source for Leaf Rust Resistance Gene in Wheat. Int.J.Curr.Microbiol.App.Sci. 9(3): 1103-1108. doi: https://doi.org/10.20546/ijcmas.2020.903.129